Delay-inducing defects are causing increasing concern in the semiconductor industry today, particularly at the leading-edge 130- and 90- nanometer nodes. To effectively test for such defects, the ...

Left-shifting DFT, scalable tests from manufacturing to the field, enabling system-level tests for in-field debug.

Growing pressure to improve IC reliability in safety- and mission-critical applications is fueling demand for custom automated test pattern generation (ATPG) to detect small timing delays, and for ...

MONTEREY, Calif. — It's getting more and more urgent for manufacturing test to cover not just stuck-at faults, but delay faults as well, a Cadence engineer argued here on Tuesday (Dec. 3). In a paper ...

Then, additional bridge patterns are generated targeting the untested net pairs to ensure any high fault potential bridges do not escape production tests. Today, the transition fault model is commonly ...

Handling timing exception paths in ATPG tools while creating at-speed patterns has always been a tough and tricky task. It is well understood that at-speed testing is a requirement for modern ...

Fault localisation, an essential component of modern software engineering, seeks to identify and isolate faulty portions of code, thereby expediting the debugging process and improving overall system ...