Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The Thermo Scientific Auto Slice and View ...
A focused ion beam scanning electron microscope (FIB-SEM) featuring a compact Time-of-Flight Secondary Ion Mass Spectrometer (ToF-SIMS) and a traditional microanalytical method of Energy Dispersive ...
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With the inventions of transmission electron microscopy (TEM) in 1931 and scanning electron microscopy (SEM) shortly after in 1937, scientists gained an unprecedented ultrastructural view of the ...
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